X-ray Fluorescence Spectrometer iEDX-150WT (Coating Thickness Gauge)

Details

1、 Product Overview

Product type:X-ray fluorescence spectrometer

Product Name: Coating thickness gauge(Optional plating solution detection, RoHS detection, alloy analysis function)

type number: iEDX-150WT

give birth to give birth to Business: Republic of KoreaISP company

2、 Product advantages

1. Coating detection, the maximum coating detection can reach5th floor.

2. For thin coating analysis, it is accurate to analyze coatings smaller than 1uin (0.025um) and gold layers of 0.2-0.5uin.

3. Can be selected simultaneouslyThe RoHS detection function accurately tests heavy metals such as lead, mercury, cadmium, chromium, barium, antimony, selenium, arsenic, etc. in the RoHS directive, and tests harmful elements such as bromine and chlorine in the halogen-free directive.

4. The optional plating solution analysis function can be performed simultaneously, and the content of gold, nickel, copper and other solutions in the solution can be analyzed in one minute with an analysis accuracy of0.01ppm，

5. It can simultaneously perform alloy composition analysis function.

6. Slotted ultra large movable fully automatic sample platform 610 * 525 (length * width), sample movement distance can reach 112 * 2x5mm (length * width * height)Specially developed for the circuit board industry.

7. Laser positioning, capable of continuous and automatic multi-point programmable measurement;

8. Multiple collimator systems can be optionally selected, with single collimator/6 collimators/7 collimators.

9. Can detect materials in solid, liquid, and powder states;

10. Low operating and maintenance costs, no consumables, and relatively low requirements for the usage environment;

11. Can perform unknown standard scanning, qualitative analysis without standard, and semi quantitative analysis;

12. Simple operation, easy to learn and understand, high quality, high performance, high stability, and fast detection results (20-40 seconds);

13. Equipped with German AmptekSI Pin detector as standard, and optional high-precision silicon drift SDD detector to ensure testing accuracy.

14. The software supports analysis without standard samples.

Compared to traditional coatings, it does not require preheating when starting up and can be measured. After measurement, it can be directly turned off, saving electricity, reducing the consumption of key components (X-ray tubes, high voltage, etc.), and reducing waiting time.
3、 Product configuration and technical specifications description

4iEDX-150WT spectrometer software functions

1) Software application
-Single coating measurement
-Linear layer measurement, such as thin film measurement
-Double coating measurement
-Simultaneous analysis of coating thickness and elements for alloys
-Three layer coating measurement.
-Measurement of electroless nickel plating
-Electroplating solution measurement
-Application of absorption mode DIN50987.1/ISO3497-A2

-Application of excitation mode DIN50987.1/ISO3497-A1
-The basic parameter method can meet the measurement needs of all application fields

2) Software calibration
-Automatic calibration curve for multi-layer analysis

-Calculation method for basic parameters using non-standard samples

-Perform multi-point repeated calibration using standard samples

-Calibration curve display parameters and automatic adjustment function

3) Software calibration function:
-Base point correction (baseline background correction)

-Multi material base point calibration, such as stainless steel, brass, bronze, etc

-Density correction

4) Software measurement function:
-Quickly start measuring

-Rapid measurement process

-Automatic measurement condition setting (light tube current, filter, ROI)

5) Automatic measurement function (software platform)

-Same mode repetition function (can achieve multi-point automatic detection)

-Confirm measurement location (with graphic display function)

-Measurement starting point setting function (storing raw data in each file)

-Measurement starting point storage function, printing data

-Rotation correction function

-TSP application

-Row scanning and grid function

6) Spectral measurement function

-Qualitative analysis function (KLM labeling method)

-Each energy/channel element ROI cursor

-Spectral file download, deletion, saving, and comparison functions

-Spectral comparison display function: two-level display/overlay display/subtraction

-Scale expansion and contraction functions (strength, energy)

7) Data processing function

-Monitoring statistics: mean, standard deviation, maximum value.

-Minimum value, measurement range, N number Cp、 Cpk，

-The independent curve displays the measurement results.

-Automatically optimize curve values and data controls

8) Other functions

-System self calibration depends on instrument conditions and operating environment

-Independent operation control platform

-Video parameter adjustment

-The instrument is connected to external devices using a single USB data bus

-Multi Ray and Smart Ray automatically output detection reports (HTML, Excel)

-Screen capture displays monitors, sample images, curves, etc

-Database inspection program

-Protection of coating thickness measurement program.

9) Instrument maintenance and adjustment functions

-Automatic calibration function;

-Optimizing the system depends on instrument conditions and operating room environment;

-During the automatic calibration process, the value increase, bias, intensity, and detector resolution depend on the peak position using iterative methods CPS、 Main X-ray intensity, input voltage, and operating environment.

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